Semiconductor Volume Resistance Tester / Testing Machine
1. Description
ZY6156 Semiconductor Volumetric Resistance Tester is suitable for measuring the volume resistivity of rubber and plastic semi-conductive materials for wires and cables. It conforms to GB/T3048.3 "Volume resistivity of semi-conductive rubber and plastic materials" test method.
2. Standards
GB/T3048.3
3. Performance Parameters
DC power supply: voltage 0 ~ 5000V adjustable
Current meter: 0 ~ 20 mA
Current electrode: 20 mm x 70 mm
Voltage electrode: 1.0 mm
The range of resistance measurement is 0 ~ 108 ohm.
The pressure of potential electrode along the width of specimen: 65 N/M
Insulation plate size: 80 mm * 180 mm
Working power supply: AC 220V, 50HZ
4. Test Environmental Conditions
Ambient temperature: 23 ± 2 ℃
Relative humidity: (50 ± 5) %
5. Test Notes
Preparation of Specimen
(1) At least three specimens of the same size are prepared for each test. The specimens are rectangular, 110 mm in length, 50 mm in width and 2 mm or 4 mm in thickness. Thickness should be measured at approximately 6 points of equal distance along the length of the specimen, and the difference between the measured value and the average value of each point should not exceed (±5%).
(2) The surface of the test piece should be clean. When necessary, the test piece can be gently scrubbed with clay mixed with water, then rinsed with distilled water, and then dried in the air. When scrubbing, the surface of the test piece should not be damaged, and the test piece should not be cleaned with organic solvent which has corrosive or swelling effect.
(3) The vulcanized or plasticized specimens should be placed for at least 16 hours before they can be used for the test, but the longest time should not exceed 28 days. The test piece used as a contrast test has the same storage time as possible.
6. Pretreatment Before Test
(1) The two ends of the sample are clamped in two current electrode fixtures and placed on the insulating board. The sample is heated for 2 hours at (70±1)℃ in a thermostat.
(2) After heating, the samples, current electrodes and insulating plates were taken out and placed for 16 hours under the environment of (23±2)℃ and (50±5)% relative humidity.
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Semiconductor Volume Resistivity Testing Equipment 23 ± 2 ℃ Ambient temperature Images
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